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Language: en
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Type: BOOK - Published: 2003-03-27 - Publisher: Cambridge University Press
A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.
Language: en
Pages: 205
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Type: BOOK - Published: 2018-12-19 - Publisher: Routledge
1997 was the 'Year of the Electron' because it marked the centenary pf the celebrated discovery of the smallest of the fundamental particles that make up ordina
Language: en
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Type: BOOK - Published: 2015-03-23 - Publisher: World Scientific Publishing Company
Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging
Language: en
Pages: 762
Pages: 762
Type: BOOK - Published: 2011-03-24 - Publisher: Springer Science & Business Media
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of th
Language: en
Pages: 224
Pages: 224
Type: BOOK - Published: 2011-02-11 - Publisher: Springer Science & Business Media
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor indus