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Introduction to Conventional Transmission Electron Microscopy
Language: en
Pages: 718
Authors: Marc De Graef
Categories: Science
Type: BOOK - Published: 2003-03-27 - Publisher: Cambridge University Press

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A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.
Introduction to Scanning Transmission Electron Microscopy
Language: en
Pages: 205
Authors: Dr Robert Keyse
Categories: Technology & Engineering
Type: BOOK - Published: 2018-12-19 - Publisher: Routledge

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1997 was the 'Year of the Electron' because it marked the centenary pf the celebrated discovery of the smallest of the fundamental particles that make up ordina
Aberration-Corrected Imaging in Transmission Electron Microscopy
Language: en
Pages: 432
Authors: Rolf Erni
Categories: Technology & Engineering
Type: BOOK - Published: 2015-03-23 - Publisher: World Scientific Publishing Company

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Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging
Scanning Transmission Electron Microscopy
Language: en
Pages: 762
Authors: Stephen J. Pennycook
Categories: Technology & Engineering
Type: BOOK - Published: 2011-03-24 - Publisher: Springer Science & Business Media

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Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of th
Physical Principles of Electron Microscopy
Language: en
Pages: 224
Authors: Ray Egerton
Categories: Technology & Engineering
Type: BOOK - Published: 2011-02-11 - Publisher: Springer Science & Business Media

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor indus